Chromacity 1280 femtosecond fiber laser
Chromacity 1280 femtosecond fiber laser
Chromacity 1280 femtosecond fiber laser

Chromacity 1280 | Femtosecond Fiber Laser

Central Wavelength

1280 nm

Bandwidth

80 nm

Pulse Width

80 fs

Rep. Rate

100 MHz

Average Power

30 mW

Pulse Energy

300 pJ

Chromacity 1280: A Femtosecond Fiber Laser for the Semiconductor Industry

The Chromacity 1280 is a unique air-cooled, compact, femtosecond fiber laser that provides exceptional performance with turnkey operation. With outstanding pulse quality and power stability, the 1280 is an ideal laser source for use in probing semiconductors, and other material characterization applications.

The 1280 laser is ultra-stable across temperature and time, offering repeatable pulse power, pulse-to-pulse and over extended periods of operation. The laser is designed to be installed remotely and does not require specialist expertise to operate. The system comes with a laser head and a separate external power supply unit (PSU) providing flexible placement options. Control is achieved using an intuitive web browser user interface, or via an RS-232 serial port, allowing easy integration into OEM equipment, or remote operation on the bench in a typical laboratory environment.

A Laser for Semiconductor Analysis

The electronics industry relies heavily upon lasers for semiconductor failure analysis (SFA) to optimize manufacturing processes and accelerate the development of disruptive technologies which are shaping emerging industries. Photonics integrated circuits (PICs), for instance, use a laser source to emit light and power components, rather than electricity. Such components parts are vital in the adoption of connectivity and autonomous sensing applications.

Between 1250 nm – 1310 nm, the Chromacity femtosecond fiber laser delivers 80 fs pulses with excellent beam quality for optical fault isolation applications, including Soft Defect Localization (SDL) and Laser Assisted Device Alteration (LADA). Soft defects are characteristic of failures found in partially functional integrated circuits. SDL imaging systems employ laser-scanning methods to generate localized heating and find defects. In contrast, LADA is a laser-based timing analysis technique which uses short wavelengths to generate photocarriers in silicon, without resulting in localized heating of the device. Chromacity’s ultrashort-pulse systems can be used in 2P LADA techniques which generate two-photon absorption-induced single event upsets (SEU) in micro-electronic devices, such as microprocessors or power transistors.

Fiber Coupling of the Chromacity 1280 Femtosecond Fiber Laser

The Chromacity 1280 laser can be fiber coupled as an option, offering polarization maintaining laser light with no degradation in pulse quality. Fiber delivery can maximize performance and reduce the number of components required to couple light into a system.

In the fiber-coupled Chromacity 1280, a fiber coupler is used to focus the laser beam into an optical fiber. Fiber coupling allows users to deliver a laser beam to places otherwise difficult to access through a complex laboratory set-up, industrial settings, or via a catheter into the brain or heart. Chromacity has achieved coupling efficiencies of over 90% using an innovative hollow core technology that allows delivering pulses of under 150fs with negligible spectral or temporal broadening.  

Chromacity 1280’s beam profile measured at a distance of 500 mm from the fiber and collimated using an aspheric lens with focal length 8 mm. Fiber has MFD of 12.6 μm.

Chromacity 1280: A Femtosecond Fiber Laser for the Semiconductor Industry

The Chromacity 1280 is a unique air-cooled, compact, femtosecond fiber laser that provides exceptional performance with turnkey operation. With outstanding pulse quality and power stability, the 1280 is an ideal laser source for use in probing semiconductors, and other material characterization applications.

The 1280 laser is ultra-stable across temperature and time, offering repeatable pulse power, pulse-to-pulse and over extended periods of operation. The laser is designed to be installed remotely and does not require specialist expertise to operate. The system comes with a laser head and a separate external power supply unit (PSU) providing flexible placement options. Control is achieved using an intuitive web browser user interface, or via an RS-232 serial port, allowing easy integration into OEM equipment, or remote operation on the bench in a typical laboratory environment.

A Laser for Semiconductor Analysis

The electronics industry relies heavily upon lasers for semiconductor failure analysis (SFA) to optimize manufacturing processes and accelerate the development of disruptive technologies which are shaping emerging industries. Photonics integrated circuits (PICs), for instance, use a laser source to emit light and power components, rather than electricity. Such components parts are vital in the adoption of connectivity and autonomous sensing applications.

Between 1250 nm – 1310 nm, the Chromacity femtosecond fiber laser delivers 80 fs pulses with an excellent beam quality for optical fault isolation applications, including Soft Defect Localization (SDL) and Laser Assisted Device Alteration (LADA). Soft defects are characteristic of failures found in partially functional integrated circuits. SDL imaging systems employ laser-scanning methods to generate localized heating and find defects. In contrast, LADA is a laser-based timing analysis technique which uses short wavelengths to generate photocarriers in silicon, without resulting in localized heating of the device. Chromacity’s ultrashort-pulse systems can be used in 2P LADA techniques which generate two-photon absorption-induced single event upsets (SEU) in micro-electronic devices, such as microprocessors or power transistors.

Fiber Coupling of the Chromacity 1280 Femtosecond Fiber Laser

The Chromacity 1280 laser can be fiber coupled as an option, offering polarization maintaining laser light with no degradation in pulse quality. Fiber delivery methods maximize performance and reduce the number of components required to couple light into a system.

In the fiber-coupled Chromacity 1280, a fiber coupler is used to focus the laser beam into an optical fiber. Fiber coupling can allow researchers to deliver a laser beam to places otherwise difficult to access, through a complex laboratory set-up, industrial settings, or via a catheter into the brain or heart. Chromacity has achieved coupling efficiencies of over 90% using an innovative hollow core technology that allows delivering pulses of under 150fs with negligible spectral or temporal broadening.  

Chromacity 1280’s beam profile measured at a distance of 500 mm from the fiber and collimated using an aspheric lens with focal length 8 mm. Fiber has MFD of 12.6 μm.

Applications of the Chromacity 1280

  • Two-photon laser-assisted device alteration (2p LADA) in silicon integrated-circuits
  • Two-photon optical beam induced current (TOBIC)
  • Material characterisation
  • Fundamental research
  • Interrogating photonics integrated circuits

Laser scanning and optoelectronic imaging of integrated circuits is crucial towards optimal semiconductor failure analysis, at a time when the industry faces global chip shortages.

With seamless integration into Laser Assisted Device Alteration (LADA) platforms, Chromacity’s robust 1280 nm laser source can help determine soft defect localization, using near-IR microscopy techniques including (2P-LADA).

Two-Photon Laser Assisted Device Alteration (2P-LADA) is a high-resolution imaging technique which exploits two-photon absorption (TPA) to deliver precise three-dimensional localisation of the photocarriers, injected by the TPA process, to accurately locate and characterise failures, with optimum spatial and temporal performance.

Similarly, the Two-Photon Optical Beam Induced Current (TOBIC) technique is another laser-scanning method for imaging integrated circuits. This technique uses ultrashort-pulse lasers to induce a photocurrent which is subsequently mapped to generate an image. TOBIC imaging occurs around 1250 – 1550 nm where the beam is easily transmitted through the silicon band gap.

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Datasheet for Chromacity 1280

1

Central Wavelength: 1280 nm
2

Pulse Width: 80fs
3

Repetition Rate: 100MHz
4

Average Power: 30mW
5

Pulse Energy: 300pJ
6

Bandwidth: 80nm
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