Beam Profiling - Camera based solutions
Home/Product/Laser Beam Characterization/Beam Profiling – Camera-based solutions
We offer a wide range of camera-based solutions covering most wavelengths (UV, VIS, NIR and SWIR). Camera-based solutions offer a direct measurement of a 2D profile based on the pixel intensity where the laser hits the sensor. Our solutions include a dedicated laser beam profiling software for plug-and-play operation.
For more information on the capabilities of these products, visit our Laser Beam Profiling
Beam profiling - Knife-edge solutions
Home/Product/Laser Beam Characterization/Beam profiling – Knife-edge solutions
The measuring technique is based on a multiple scanning knife-edge technology, combined with a tomographic image reconstruction for the creation of the 2D/3D profiles. The Beam Analyzers allows to measure very small beams with high resolution (0.1 µm), accuracy and dynamic range, where standard camera-based system fall short because of their fixed pixel pitch in the order of a few microns.
- Measures accurately profile, shape, size, position and power of CW lasers
- Measures beams as small as 3 µm and up to 9 mm
- Measures wavelengths from deep UV to 2,700 nm depending on detector version
Beam profiling - Large format solutions
Home/Product/Laser Beam Characterization/Beam profiling – Large format solutions
Solutions for the measurement of large laser beams (typically greater than 10mm). We offer two techniques:
- large active area CMOS camera-based systems with direct ‘on-pixel’ measurements (CinCam CMOS 3501 and 3502)
- large active area screen-based system with camera for indirect measurements (BeamOn LA)
Beam profiling - High Power solutions
Ultrafast Laser Measurement
Home/Product/Laser Beam Characterization/Ultrafast Laser Measurement
Ultrafast Laser Measurement
We provide innovative devices for temporal measurement (ROC and FROG), spectral measurement (MISS spectrometer). They are suitable for a broad wavelength range (from UV to mid-IR) and a large pulse duration range, from 5 fs to 80 ps. Those instruments can be installed in only 2 minutes with no necessary calibration. Each product is designed to provide accurate and reliable measurements, whatever the experimental conditions. They can yield proper measurements without caring about the accuracy of the alignment.
Home/Product/Laser Beam Characterization/M² Measurement
These tools are dedicated to accurately measure the full beam caustic of a focused or raw beam.
According to ISO 11146-1/2, CinSquare & FBP systems measure the complete beam caustic and determines M², waist position, divergence, etc., related to the reference plane.
The Focus Beam Profiler is dedicated for high power lasers such as those used in additive manufacturing processes (SLM, SLS). CinSquare is the ideal tool for lab characterization of lasers from the UV to SWIR but can also be implemented in production thanks to a robust design resulting in high accuracy and high repeatability.